Study the growth of  layers, their composition and defects in semiconductors by using Transmission Electron Microscopy (TEM) UV-visible (UV-V is.) spectrophotometer, Vibrating sample magnetometer (VSM).

Author(s)	Dr. Laveena Manju Latha
Country	India
Abstract	This paper deals with Transmission Electron Microscopy (TEM) Importance. The TEM is a very important technique for material science. A high energy beam of electrons is shone through a very thin material, and the interactions between the atoms and the electrons can be used to examine the crystal structure and features in the structure like grain boundaries and dislocations. And the chemical analysis can also be analyzed. To study the growth of layers, their composition and defects in semiconductors by using TEM analysis. The material quality, size, shape, and density of quantum wells, dots and wires are exactly analyzed when take the image at high resolution.
Keywords	Transmission Electron Microscopy (TEM) UV-visible (UV-V is.) spectrophotometer, Vibrating sample magnetometer (VSM), EDAX detector.
Field	Physics > Nano Technology / Nuclear
Published In	Volume 8, Issue 2, July-December 2017
Published On	2017-12-06

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Journal of Advances in Developmental Research